Structure and method for overlay marks

ABSTRACT

A partially fabricated semiconductor device includes a semiconductor overlay structure. The semiconductor overlay structure includes a first gate stack structure over the semiconductor substrate, the first gate stack structure being configured as an overlay mark in an overlay region of the semiconductor substrate. The semiconductor overlay structure further includes a doped region in the semiconductor substrate surrounding the first gate stack structure. The doped region has a first dopant concentration greater than or equal to a second dopant concentration next to a second gate stack structure in a device region of the semiconductor substrate.

PRIORITY CLAIM

The present application is a divisional of U.S. application Ser. No.13/293,650, filed Nov. 10, 2011, which claims priority of U.S.Provisional Application No. 61/418,064, filed Nov. 30, 2010, which areincorporated herein by reference in their entireties.

TECHNICAL FIELD

The present disclosure relates generally to overlay marks forlithographic processes and, more particularly, to a structure and methodfor an improved overlay mark for high-k metal gate processes.

BACKGROUND

Overlay marks are important in fabrication of semiconductor, orintegrated circuit (“IC”), devices because the devices are produced byaligning several layers of conductive, semiconductive, and insulativematerials one atop the other. It is critical that each layer isprecisely aligned with the previous layer so that the resultant circuitsare functional and reliable. If the layers are not correctly aligned,some features may be short-circuited while others may be open circuitedor have an unacceptably large resistance. Typically for each technologynode, an overlay error threshold is specified in the x or y direction.In other words, each layer cannot shift more than a specified distancefrom another layer above or below. A shift greater than thespecification causes an “alignment fail”, which increases cycle timebecause layers may have to be reworked.

During an overlay check, the position of the overlay mark on the waferis typically sensed using a laser beam, which is bounced off the overlaymark to produce a reflected light signal reflected back to an inspectoron a machine. The inspector then analyzes the reflected light signal todetermine the exact position of the overlay mark. Notably, the qualityof the signal reflected from the overlay mark is directly dependent onthe the structure and the materials. Methods to improve overlay marksignals continue to be sought.

BRIEF DESCRIPTION OF THE DRAWINGS

The present disclosure is best understood from the following detaileddescription when read with the accompanying figures. It is emphasizedthat, in accordance with the standard practice in the industry, variousfeatures are not drawn to scale. In fact, the dimensions of the variousfeatures may be arbitrarily increased or reduced for clarity ofdiscussion.

FIG. 1 is a flowchart of a method for making a semiconductor structurehaving an overlay mark constructed according to various aspects of thepresent disclosure.

FIGS. 2-10 are sectional views of a semiconductor structure having anoverlay mark at various fabrication stages constructed according tovarious aspects of the present disclosure in various embodiments.

FIGS. 11A and 11B are top views of overlay marks of the semiconductorstructure of FIG. 8 constructed according to various aspects of thepresent disclosure.

DETAILED DESCRIPTION

The present disclosure relates generally to overlay marks forlithographic processes and, more particularly, to a structure and methodfor an improved overlay mark for high-k metal gate (HKMG) lithographyprocesses. It is to be understood that the following disclosure providesmany different embodiments, or examples, for implementing differentfeatures of various embodiments. Specific examples of components andarrangements are described below to simplify the present disclosure.These are, of course, merely examples and are not intended to belimiting. In addition, the present disclosure may repeat referencenumerals and/or letters in the various examples. This repetition is forthe purpose of simplicity and clarity and does not in itself dictate arelationship between the various embodiments and/or configurationsdiscussed. Moreover, the formation of a first feature over or on asecond feature in the description that follows may include embodimentsin which the first and second features are formed in direct contact, andmay also include embodiments in which additional features may be formedinterposing the first and second features, such that the first andsecond features may not be in direct contact.

During a lithography exposure process, a wafer may be exposed to apattern on a photomask in many steps. A wafer also may be separated intomany fields where each field is exposed separately using the samephotomask. To ensure that successive layers are stacked correctly,alignment marks and overlay marks are used. Alignment marks on a waferare not field specific and each wafer may include two or more groups ofalignment marks at different locations. When a wafer is loaded onto astepper for exposure to a pattern from a photomask, the wafer is firstaligned using the alignment marks. The stepper reads the alignment marksto orient the wafer before stepping through exposing each field.

Overlay marks are used to ensure successive mask exposures are overlaidover each other within a tolerance specified by the technology node.Overlay marks are repeated in each field, usually at multiple locationswith several marks formed at each location. Each field includes one ormore device regions where semiconductor devices are formed, and one ormore overlay mark regions. Common overlay patterns include agrating-based mark or a box-in-box mark. A box-in-box mark is formedfirst by forming the outer box while forming a feature in the deviceregion and then forming the inner box while forming another feature inthe device region. The boxes are analyzed by measuring a light reflectedfrom them. The centers of the outer box and the inner box are calculatedand compared. An overlay error is defined as the distance between thecenters of the two boxes. A minimum one-dimensional error in the x orthe y direction is usually specified to be a percentage of the halfpitch of a feature in the technology node. For example, for the 20nanometer (nm) technology node, the one-dimensional overlay error isspecified to be less than 6 nm.

To determine an overlay error in a box-in-box mark, the centers of atleast two layers in an overlay mark are compared. An overlay region in afield includes many marks with each mark having a different combinationof layers. One overlay mark may include an oxide definition (OD) layerand a polysilicon (poly) layer. Another overlay mark may include the ODlayer and a contact layer. Yet another overlay mark may include thecontact layer and a poly layer. Thus, each mark can provide one or moreoverlay error values. The relevance of a particular overlay errordepends on where the wafer is in the semiconductor manufacturingprocess.

Various methods are used to reduce overlay error before, during, orafter exposure. Commonly, overlay errors are checked after the exposureoperation in a separate inspection tool. A wafer having unacceptableoverlay errors for that particular manufacturing step is reworked byremoving and re-depositing the photoresist layer and re-exposed. Whilein-situ overlay correction during the exposing operation is desirablefor reducing time-consuming rework, it introduces much delay during thelithography operation if the overlay error measurement occurs justbefore each field exposure. Another effective method is a correction perexposure (CPE) technique that uses stored overlay error values andimproves process time over in-situ measurement methods. While variousoverlay correction methods are developed and used to improve overlayerrors from field to field, the quality of the overlay correction isdirectly affected by the measurement of the overlay marks andcalculation of the center of the boxes.

To measure a precise location of the layers in the overlay mark, aninspection tool measures light reflected across the mark. The signalreceived from different areas of the overlay mark differs based on thedifference in material properties of the layers. The signal is thennormalized, and an algorithm is used to find the edge location of thelayers. When the material properties of the different layers aresimilar, the interface between the layers may be difficult to determine.Material property factors that influence the quality of the signalinclude reflectivity, refractive index, surface roughness, andthickness. Process conditions such as incident light angle, shadowing,inspection light wavelength can also influence signal quality. The edgelocation of the material layer forming a box as determined by thealgorithm can have large errors. A quantified quality of the signal isknown as wafer quality (WQ), which is expressed as a percentage ofactual signal strength with reference to a signal generated by areference mark. WQ may be defined asWQ=(SS _(overlay)/Gain_(overlay))/(SS _(ref) /Gain _(ref))

Where SS_(overlay) is the signal strength of the overlay signal from theoverlay mark, Gain_(overlay) is the signal strength of the gain of theoverlay signal, SS_(ref) is the signal strength of the reference signalfrom the reference mark, and Gain_(ref) is the gain of the referencesignal.

Usually, WQ should be more than 1% in order to obtain reliable overlayresults. A WQ less than 1% can correspond to enough measurement errorfor box centers such that subsequent CPE or other correction causesfurther overlay error. For example, a small true overlay error may bereported as a larger overlay error in the opposite direction, such thata CPE processing causes the true overlay error to increase, instead ofcorrecting for the overlay error. With high-k metal gate replacingpolysilicon, the structure of the overlay provides a WQ less than 1%,such as 0.05%-0.4%. Various factors that can lower the WQ includemeasurement variations from field to field (local effect), wafer edgedistortion (edge die effect), and damage to an OD dummy layer causingdiscoloration. As feature sizes decrease, the specified overlay errorthreshold also decreases. Coupling to the ever more stringent overlayerror threshold is the decrease in signal contrast caused by usingadvanced materials to form various structures.

In one aspect, various embodiments of the present invention pertain toprocesses and structures that improve WQ in overlay regions forsemiconductor devices using advanced metal gate materials, such ashigh-k metal gate (HKMG). In one embodiment, using the disclosedstructure increases the WQ to be greater than 3%, as averaged overdifferent inspector light sources: red, green, near infrared, and farinfrared. The process includes subjecting the substrate areas adjacentto the overlay mark to various ion implantations that are used to formvarious features in the device region. The various ion implantationsdecrease the refractive index of the substrate to about 3 or less thanabout 3. The structure has improved WQ because the contrast between theoverlay layer and adjacent substrate material is higher than with anundoped substrate or a lightly doped substrate. In other words, thevarious embodiments of the present disclosure work by darkening thesemiconductor substrate area as seen by the inspector tool relative tothe lighter overlay layers.

In certain embodiments, the process includes: providing a semiconductorsubstrate having a device region and an overlay region; performing afirst ion implantation to the semiconductor substrate within the deviceregion and the overlay region; forming a first polysilicon gate stack ina device region and a second polysilicon gate stack in an overlayregion; performing a second ion implantation; performing a third ionimplantation; and replacing the first and second polysilicon gate stackswith metal gate stacks. After the various ion implantation operations,the total boron ion implantation dosage to the semiconductor substratewithin the overlay region is greater than about 2×10¹⁵ ions/cm².

The process may also include measuring an overlay error using the metalgate stacks in the overlay region and another overlay layer,correctively exposing a photoresist layer using the overlay error, andoptionally forming an interlayer dielectric (ILD) material layer on thesemiconductor substrate. In most embodiments, the second ionimplantation and the third ion implantation are applied to the firstpolysilicon gate stack and the semiconductor substrate within the deviceregion and to the second polysilicon gate stack and the semiconductorsubstrate within the overlay region. In some embodiments, one or more ofthe ion implantation operations may be applied to HKMG stack. Theprocess may also include performing one or more ion implantations tostructures and the semiconductor substrate within the device region andto structures and the semiconductor substrate within the overlay region,which may occur before or after replacing the gate stacks.

According to various embodiments, the total ion implantation dosage mayinclude arsenic at greater than about 3×10¹⁵ ions/cm² and one or more ofindium at greater than about 1×10¹⁴ ions/cm², nitrogen at greater than1.2×10¹⁵ ions/cm², and carbon at greater than about 2.4×10¹⁵ ions/cm².In certain embodiments, the second ion implantation includes n-typelight-doped drain (n-LDD) doping process with doping dose greater thanabout 2×10¹⁴ ions/cm². In some embodiments, performing the first, thesecond, and the third ion implantations increases a wafer quality of anoverlay signal from the overlay region to be greater than about 3%.

Another aspect of the present disclosure pertains to partiallyfabricated semiconductor wafers that include a semiconductor overlaystructure. The semiconductor overlay structure includes a gate stackstructure formed on the semiconductor substrate and configured as anoverlay mark in an overlay region on a semiconductor wafer, a dopedsemiconductor substrate on both sides of the gate stack structure,wherein the doped semiconductor substrate includes a dopantconcentration that is at least the same or higher than as the dopantconcentration in the semiconductor substrate next the gate stackstructures in a device region on the semiconductor wafer. The overlaystructure may further include a contact layer formed on thesemiconductor substrate in the vicinity of the gate structure, andwherein the doped semiconductor is disposed between the gate stackstructure and the contact layer.

In some embodiments, the gate stack structure includes a high-kdielectric material layer and a metal layer disposed on the high-kdielectric material layer or a silicon oxide layer and a polysiliconlayer disposed on the silicon oxide layer. The gate stack structure isconfigured as a grating structure or as one box of a box-in-boxstructure. The contact layer may be configured as an inner box of thebox-in-box structure. In certain embodiments, the dopant in thesemiconductor substrate includes one or more of boron containingcompounds, such as boron fluoride (BF₂), arsenic (and/or phosphorus),indium, nitrogen, and carbon. The semiconductor substrate in the overlayregion includes silicon and may have a refractive index of about 3 orless.

FIG. 1 is a flowchart of a method 100 for making a semiconductor deviceaccording to one embodiment. The semiconductor device includes a metalgate stack and an overlay mark constructed according to various aspectsof the present disclosure. FIGS. 2 through 10 are sectional views of asemiconductor structure 200 at various fabrication stages andconstructed according to various embodiments. The semiconductorstructure 200 and the method 100 of making the same are collectivelydescribed with reference to FIGS. 1 through 10.

Referring to FIGS. 1 and 2, the method 100 begins at step 102 byproviding a semiconductor substrate. The semiconductor substrateincludes silicon. Alternatively, the semiconductor substrate includesgermanium, silicon germanium or other proper semiconductor materials.The semiconductor substrate also includes various isolation features,such as shallow trench isolation (STI) features formed in thesemiconductor substrate to separate various devices. The semiconductorsubstrate includes an overlay region 212 for an overlay mark and adevice region 214 for one or more field-effect transistors (FETs) and/orother devices. Various STI features 216 are formed in the semiconductorsubstrate 210 in the device region 214. The formation of the STIfeatures 216 includes etching a trench in a substrate and filling thetrench by one or more insulator materials, such as silicon oxide,silicon nitride, or silicon oxynitride. The filled trench may have amulti-layer structure such as a thermal oxide liner layer with siliconnitride filling the trench. In one embodiment, the STI feature 216 iscreated using a process sequence such as: growing a pad oxide, forming alow pressure chemical vapor deposition (LPCVD) nitride layer, patterningan STI opening using photoresist and masking, etching a trench in thesubstrate, optionally growing a thermal oxide trench liner to improvethe trench interface, filling the trench with CVD oxide, using chemicalmechanical planarization (CMP) to etch back, and using nitride strippingto leave the STI features. The semiconductor substrate 210 also includesvarious n-wells and p-wells formed in various active regions.

Still referring to FIGS. 1 and 2, the method 100 proceeds to step 104 byperforming a first ion implantation to introduce doping species in thesemiconductor substrate 210 in the device region 214 and semiconductorsubstrate 211 in the overlay region 212. The first ion implantation 218includes one or more ion implantations implemented before the formationof gate stacks to form various doped features 219. In one embodiment,the first ion implantation 218 includes a well ion implantation to forma well, such as an n-type well (n-well) or a p-type well (p-well), anion implantation to adjust threshold voltage, an anti-punch through(APT) ion implantation, or combinations thereof. An ion implantationprocess 218 is applied to the device region 214 and overlay region 212such that doping species form the respective doped feature 219 in thedevice region, and the entire substrate 210 in the overlay region 212 isdoped.

In one example, when a p-type dopant is introduced to the semiconductorsubstrate to form one or more p-wells, an implant mask layer ispatterned to cover a portion of the device region for an n-well, then ap-type dopant is introduced to the semiconductor substrate 210 by an ionimplantation to form one or more p-wells in the device region 214. Theimplant mask layer may be formed using a photolithography processincluding photoresist coating, soft baking, exposing, post-exposurebaking (PEB), developing, and hard baking. The implant mask layer isremoved thereafter using a suitable process, such as wet stripping orplasma ashing. Alternatively, a patterned photoresist layer may be usedto pattern a hard mask layer to be used as an implant mask. According tovarious embodiments, the semiconductor portion 211 in the overlay regionreceives all or most of the dopants implanted in the device region whilevarious portions of the device region are covered during theimplantation process to form various features. Thus, the semiconductorportion 211 in the overlay region 212 receives a higher dopant dosagethan the semiconductor portion 210 in the device region 214.

Referring to FIGS. 1, 3 and 4, the method 100 proceeds to step 106 byforming gate stacks in the device region 214 and the overlay region 212.In one embodiment, various gate material layers are formed on thesemiconductor substrate 210 and 211 as illustrated in FIG. 3. The gatematerial layers include a dielectric material layer 220 and a siliconlayer 222, such as polycrystalline silicon (polysilicon). In the presentembodiment, the silicon layer 222 may be non-doped and the dielectricmaterial layer 220 includes a high-k dielectric material layer. Thesilicon layer 222 alternatively or additionally may include amorphoussilicon. The high-k dielectric material layer 220 includes a dielectricmaterial having the dielectric constant higher than that of thermalsilicon oxide, which is about 3.9. In one example, the high-k dielectriclayer 220 includes hafnium oxide (HfO). In various other examples, thehigh-k dielectric layer 220 includes metal oxide, metal nitride, orcombinations thereof. In one example, the high-k dielectric layer 220has a thickness ranging between about 10 angstrom and about 100angstrom.

In various embodiments, the gate material layers include multi-layerdielectric materials, such as an interfacial layer (e.g., silicon oxide)and a high-k dielectric material layer disposed on the interfaciallayer. In another embodiment, a hard mask layer 224, such as siliconnitride (SiN) or silicon oxide (SiO₂), is further formed on the gatematerial layers for gate patterning. In various embodiments, theinterfacial layer may be formed by chemical oxide technique, thermaloxide procedure, atomic layer deposition (ALD) or chemical vapordeposition (CVD). The high-k dielectric material layer may be formed byCVD, ALD, plasma enhanced CVD (PE CVD), or plasma enhanced ALD (PEALD).The non-doped amorphous silicon or polysilicon layer 222 can be formedusing CVD with precursor silane (SiH₄) or other silicon based precursor.The deposition of the non-doped amorphous silicon layer 222 can beperformed at a raised temperature. The hard mask layer (SiN or SiO₂) canbe formed by CVD or other suitable technique.

The gate material layers are patterned to form one or more gate stacks226 and 228 in the overlay region 212, and one or more gate stacks (ordummy gates) 229 in the device region 214, as illustrated in FIG. 4. Thepatterning of the gate material layers can be achieved by a lithographyprocess and/or an etch process. For example, a patterned photoresistlayer is formed on the hard mask layer 224 defining various gateregions, using a photolithography process including photoresist coating,soft baking, exposing, post-exposure baking (PEB), developing, and hardbaking. Then, the hard mask layer 224 is etched through the openings ofthe patterned photoresist layer, forming a patterned hard mask. The gatematerial layers are further etched using the patterned hard mask,forming the various gate stacks. The patterned photoresist layer isremoved thereafter using a suitable process, such as wet stripping orplasma ashing. Alternatively, if the hard mask layer is not present,then the patterned photoresist layer is directly utilized as an etchmask to etch the gate material layers.

The gate stack 226 is configured to form one layer in an overlay mark.In one embodiment, the gate stack in the overlay region 212 isconfigured as a periodic structure to form a grating overlay mark. Forexample, the grating overlay mark includes two, three, four, or moregate stacks disposed periodically in parallel. In another embodiment,the overlay mark includes a gate stack designed as a square frame usedby box-in-box or frame-in-frame overlay technologies. At the same time,the gate stack 229 is formed in the device region 214 for a field-effecttransistor (FET), such as a metal-oxide-semiconductor (MOS) transistor.The FET can be an n-type field-effect transistor (nFET) or a p-typefield-effect transistor (pFET). Alternatively, the gate stack 229 isformed in the device region 214 for an imaging sensor.

Referring to FIGS. 1 5 and 6, the method 100 proceeds to step 108 byperforming a second ion implantation to introduce doping species intothe semiconductor substrate 210 and 211 in both device region 214 andthe overlay region 212. The second ion implantation is implemented afterthe formation of the gate stacks (e.g. 226 and 228) at step 106. Thesecond ion implantation may include various implantation steps to formrespective doped features. In one embodiment, the second ionimplantation includes light doped drain (LDD) ion implantation andheavily doped source and drain (S/D) implantation. Since the second ionimplantation is implemented after the formation of the gate stacks atstep 106, the corresponding doped features are substantially formed onsides of the gate stacks but not in the channel regions directlyunderlying the gate stacks.

The second ion implantation may include an LDD implantation 230 to formvarious LDD features 232 in the overlay region 212 and the device region214, as illustrated in FIG. 5. In one example, an n-type dopant, such asphosphorous or arsenic, is introduced to the semiconductor substrate 210in the device region 214 and the semiconductor substrate 211 in theoverlay region 212 to form n-type LDD features. In the overlay region212, the difference in the refractive index between the siliconsubstrate underlying the gate stack and LDD implanted silicon substratecan enhance the contrast of the overlay mark during the overlayinspection. In one example, the LDD implantation includes a dose about10¹⁵ ions/cm² or greater than about 2×10¹⁴ ions/cm². In another example,the LDD implantation includes an implant energy ranging between about 50keV and about 100 keV. In one embodiment, the photomask having a LDDimplant pattern defines an additional opening for the overlay region.For example, if the overlay region 212 has dimensions of 50 micron×882micron, the corresponding photomask has an additional opening of 50microns×882 microns for the overlay region 212 such that the LDDfeatures are formed therein. In another embodiment, a p-type dopingspecies, such as boron (B), may be alternatively used to form p-type LDDfeatures in the overlay region 212.

The second ion implantation may further include heavily doped source anddrain (S/D) features formed by another ion implantation step after theLDD. Therefore each gate stack in the device region 214 and the overlayregion 212 include both LDD features and S/D features, collectivelyreferred to as source and drain regions. When the device region 214includes both n-type FETs (nFETs) and p-type FETs (pFETs), the sourceand drain regions are formed, respectively, for the n-type FETs and thep-type FETs, using proper doping species.

In one embodiment, taking n-type FETs as an example, the LDD features232 are formed by an ion implantation with a light doping dose.Thereafter, sidewall spacers 234 are formed by dielectric deposition andanisotropic etch, such as plasma etch. Then, the heavily doped S/Dfeatures are formed by an ion implantation 236 with a heavy doping dose.The various source and drain features of the p-type FETs can be formedin a similar procedure but with opposite doping types.

In various embodiments, during various doping processes to form variousn-type source and drain features, the semiconductor substrate 211 in theoverlay region 212 is also doped, as illustrated in FIG. 6 and in step110 of method 100 in FIG. 1. The sidewall spacer 234 can be formed tothe gate stacks in the overlay region as well. In one embodiment, a hightemperature annealing process may be followed to activate the variousdoping species in the source and drain features in the device region214. In another embodiment, the second ion implantation additionally oralternatively includes a pocket ion implantation using the dopantopposite from that of the source and drain, and is formed in thesubstrate and adjacent to the channel region.

Referring to FIGS. 1, 7 and 8, the method 100 proceeds to step 112 byforming metal gates in the device region 214 and the overlay region 212.In one embodiment, an inter-layer dielectric (ILD) layer 242 is firstformed on the semiconductor substrate 210. The ILD layer 242 includessilicon oxide, low k dielectric material, other suitable dielectricmaterials, or combinations thereof. In another embodiment, the ILD layer242 includes a buffer silicon oxide layer, a contact etch stop layer(CESL) formed on the buffer silicon oxide layer, and another dielectricmaterial layer disposed on the CESL. The formation of the ILD layer 242is described below.

The ILD layer 242 is formed by a suitable technique, such as CVD. Forexample, a high density plasma CVD can be implemented to form the ILDlayer 242. In one embodiment, the ILD layer 242 deposits on thesemiconductor substrate 210, and fills in the gaps between the gatestacks in the overlay region 212 and the gaps between the gate stacks inthe device region 214. In furtherance of the embodiment, the ILD layer242 is formed on the substrate to a level above the top surface of thegate stacks 226 and 229. A chemical mechanical polishing (CMP) processis then applied to the ILD layer 242 to reduce the thickness of the ILDlayer 242 such that the gate stacks 226 and 229 are exposed from the topside. The processing conditions and parameters of the CMP process,including slurry chemical and polishing pressure, can be tuned topartially remove and planarize the ILD layer 242. The CMP process maypartially or completely remove the hard mask layer 224.

After the formation of the ILD layer 242, an etch process is applied toremove the polysilicon or amorphous silicon of the gate stack 229 withinthe device region 214 and the overlay region 212. If the hard mask ispresent and is not removed at the CMP step, the etch process removes thehard mask layer 224 as well. In one embodiment, the etch processincludes two steps where the first step is designed to remove the hardmask layer 224 and the second step is designed to remove the silicon inthe gate stacks in the device region 214 and the overlay region 212.After the silicon in the gate stacks is removed, trenches result in theILD layer 242 and are referred to as gate trenches.

In one embodiment, the first etch step to remove the hard mask layer 242may include phosphoric acid (H₃PO₄) solution, hydrofluoric acid (HF), orbuffered HF if the hard mask layer 224 include silicon nitride. Inanother embodiment, the etching process used to remove the polysilcionor amorphous silicon of the gate stacks may be dry etching, wet etchingor combinations thereof. In one example, an etching solution includingHNO₃, H₂O and HF, or NH₄OH solution, may be used to remove polysilicon(or amorphous silicon). In another example, chlorine (Cl)-based plasmamay be used to selectively remove the polysilicon.

After the formation of the gate trenches, one or more metal gatematerial layers are formed in the gate trenches. In one embodiment, ametal layer 246 of a proper work function (referred to as a workfunction metal) and a conductive layer 248 are filled in the gatetrenches. In one embodiment, the gate trenches in the device region 214and overlay region 212 are deposited with a work function metal layer246 and are then filled with the conductive material 248, forming a gateelectrode for a nFET. The work function metal 246 for the nFET isreferred to as a n-metal. The n-metal includes a metal-based conductivematerial having a work function compatible to the nFET. For one example,the n-metal has a work function of about or less than about 4.2 eV. Inone embodiment, the n-metal includes tantalum (Ta). In anotherembodiment, the n-metal includes titanium aluminum nitride (TiAlN). Inother embodiments, the n-metal includes Ta, TiAl, TiAlN, or combinationsthereof. The n-metal may include various metal-based film as a stack foroptimized device performance and processing compatibility. The n-metallayer can be formed by a suitable process, such as PVD. The conductivematerial layer 248 may include aluminum, tungsten or other suitablemetal. Then, a CMP process may be applied to remove the excessive workfunction metal and the conductive material. In one embodiment, thedevice region 214 includes both nFETs and pFETs. In this embodiment, themetal gates are formed for the nFETs and pFETs, respectively by a properprocedure. For example, after the removal of the silicon from thesilicon gate stacks, the metal gates for the nFETs and the overlay markare formed by a deposition for the n-metal layer, a deposition for theconductive layer, and a CMP process to remove the excessive n-metallayer and the conductive layer while the pFETS are protected by apatterned photoresist layer. Then the metal gates for pFETs are formedby a deposition for the p-metal layer, a deposition for the conductivelayer, and a CMP process to remove the excessive p-metal layer and theconductive layer. Alternatively, a p-metal layer is deposited for thepFETs while the nFETs are protected by a patterned photoresist layer. An-metal layer is deposited for the nFETs and the overlay mark while thepFETs are protected by a patterned photoresist layer. Then, a conductivelayer is deposited to fill gate trenches for nFETs, pFETs and theoverlay mark. A CMP process is applied to the substrate to remove theexcessive portion of the n-metal layer, p-metal layer, and conductivelayer, forming the metal gates for nFETs, pFETs and overlay mark.

The p-metal includes a metal-based conductive material having a workfunction compatible to the pFET. For one example, the p-metal has a workfunction of about 5.2 eV or greater. In one embodiment, the p-metalincludes titanium nitride (TiN) or tantalum nitride (TaN). In otherembodiments, the p-metal include TiN, tungsten nitride (WN), tantalumnitride (TaN), or combinations thereof. The p-metal may include variousmetal-based film as a stack for optimized device performance andprocessing compatibility. The p-metal layer can be formed by a suitableprocess, such as physical vapor deposition (PVD), CVD, ALD, PECVD, PEALDor spin-on metal. The conductive material thereafter substantially fillsin the gate trench. The conductive material includes aluminum ortungsten according to various embodiments. The method to form theconductive material may include PVD, CVD, ALD, PECVD, PEALD or spin-onmetal. Then, a CMP process may be applied to remove the excessive workfunction metal and the conductive material, forming the metal gate.Although the semiconductor structure 200 only illustrates onefield-effect transistor in the device region 214, a plurality of FETsand other devices can be formed in the device region. The presentprocess to form the metal gates may have other alternative embodiment.For example, the metal gate for nFETs and pFETs may be formed by othersequence or other procedure.

In one embodiment, the metal gates may include a step to deposit ahigh-k dielectric material layer 244 the silicon oxide layer 220 in thegate trenches, and then a work function metal layer and a conductivelayer are formed on the high-k dielectric material layer 244. Thisprocess is referred to as a high-k last process. Alternatively, in thehigh-k last process, the silicon oxide layer 220 is first removed beforeforming the work function metal layer and conductive material layer. Inthis case, a new interfacial layer, such as silicon oxide, is firstformed on the semiconductor substrate 210, then the high-k dielectricmaterial layer, work function metal layer and conductive material layerare formed in the corresponding gate trenches.

As described above, the overlay mark in the overlay region 212 includingthe gate stack 226 in the overlay region 212 is replaced by a metalgate. Particularly, the polysilicon in the gate stack 226 is replaced toform metal gates similar to the metal gate for the n-FETs in the deviceregion 214 and formed in the same process to form the metal gates forthe n-FETs. Therefore, the gate stacks in the overlay region 212 includethe n-metal layer and the conductive material layer. In another example,the polysilicon gate stack 226 may be replaced to form metal gatessimilar to the metal gates for the p-FETs in the device region 214 andformed by the same process to form the metal gates for the p-FETs. Inthis case, the gate stacks in the overlay region 212 include the p-metallayer and the conductive material layer.

In another embodiment, the gate stacks for the overlay mark in theoverlay region 212 remain as polysilicon gate stacks withoutreplacement. In this case, the overlay region 212 is covered by apatterned mask layer such as a patterned photoresist layer or apatterned hard mask layer during the gate replacement to form metalgates for devices in the device region 214, as illustrated in FIG. 9.

Referring to FIG. 10, the method 100 may proceed to step 114 by formingcontact holes to electrical interconnection. In one embodiment, acontact etch stop layer (CESL) 250 is formed on the ILD layer 242 andanother ILD layer 252 is formed on the CESL 250. Then a photoresistlayer (not shown) is coated on the semiconductor structure 200 in alithography process, and a soft baking may be applied to the coatedphotoresist layer. Then a photomask (or mask) having a contact patternis placed on the lithography exposure apparatus and the semiconductorstructure 200 is secured on a wafer stage of the lithography exposureapparatus. Then the photomask is aligned to the semiconductor structure200 before exposing the coated photoresist layer. The overlay operationuses the overlay mark including the gate stack 226 in the overlay region212. The overlay mark is further described with additional reference toFIG. 11A and 11B.

FIGS. 11A and 11B are top views of an overlay mark of the semiconductorstructure of FIG. 8 constructed according to various aspects of thepresent disclosure. In FIG. 11A, an overlay mark is labeled with numeral260. The overlay mark 260 is formed in the overlay region 212 of FIG. 8.The overlay mark 260 includes gate stack 226 and another layer 262.Layer 262 may be dummy oxides marking the OD layer or another overlaylayer. In one example, the gate stacks have a width of about 1.6 micronand a spacing of about 1.6 micron.

In yet another embodiment as shown in FIG. 11B, the overlay mark 270 mayinclude two sets of overlay layers configured to a grating structurewith horizontal layer and vertical layers. One type of overlay layer maybe horizontal, for example, multiple gate stacks 226. Another type ofoverlay layer may be vertical, for example, multiple layers of dummyoxide formed during the OD layer. In some embodiments, the gratingstructure in one orientation may include layers formed during differentmanufacturing steps, so that layers 226 and 274 may be different overlaylayers. In another embodiment, a second set of grating marks may beoriented in the same direction but with a different grating pitch. Thevarious embodiments in accordance with the present disclosure can alsobe used to improve the contrast between the grating marks and underlyingsubstrate.

As the substrate 211 is doped by one or more doping processes, such asLDD doping, heavily doped S/D, and/or pocket implant, the refractiveindex of the substrate 211 is changed, and the WQ of the overlay signalis substantially increased.

Before exposing a photoresist in a lithography operation, thesemiconductor wafer is positioned by the wafer stage to align betweenthe photomask and the wafer by utilizing an alignment structure in analignment operation. After the alignment, the coated photoresist layeris exposed field by field. In certain embodiments, the exposureparameters are adjusted field by field in a correction per exposure(CPE) technique based on prior acquired overlay error information. Othersteps in the lithography process, such as post exposure baking (PEB),developing and hard baking, may follow to form the patterned photoresistlayer with the pattern aligned with the other features (gate stacks,source and drain features) in the semiconductor structure. An etchprocess is applied to the ILD layers 242 and 252 and form contact holesin the ILD layers. Other processing steps may be subsequentlyimplemented. In another embodiment, a conductive material, such astungsten, is filled in the contact holes to form contacts. In oneembodiment, a silicide is first formed on the semiconductor substrate210 to reduce the contact resistance. The conductive material isthereafter filled in the contact holes to form contacts. A CMP processmay subsequently remove the excess conductive material.

Although not shown, other alternative features and processing steps maybe present. For example, the p-metal layer and n-metal layer or otherlayers may be formed in different orders or using a different processthan that described above. Other processing steps may be implementedbefore, during and/or after the formation of the gate stacks and theoverlay marks. For example, multilayer interconnections may be furtherformed after step 114. The multilayer interconnection includes verticalinterconnects, such as conventional vias and horizontal interconnects,such as metal lines. The various interconnection features may usevarious conductive materials, such as including copper, tungsten andsilicide.

The various embodiments in accordance with the present disclosure applyto a number of overlay mark combinations, not just the OD layer and thegate stack. As illustrated in FIG. 11A, a particularly important overlaymark 260 on a substrate includes the gate stack 262 and contact layers261 with the ILD layer 263 in between. This overlay mark 260 is used toalign subsequent layers during the interconnect formation wherealignment for via landing is important. Inaccurate CPE caused by overlayerror measurement error can cause device failure.

According to various embodiments, in order to achieve a refractive indexof the semiconductor substrate in the overlay region to sufficientlyimprove WQ of the overlay signal a combined ion implantation borondosage is greater than about 2×10¹⁵ ions/cm² or greater than about2.5×10¹⁵ ions/cm². In some embodiments, a boron-containing compound suchas boron fluoride (BF₂) may be used. A minimum combined ion implantationarsenic, phosphorus, or combined arsenic and phosphorus dosage isgreater than about 3×10¹⁵ ions/cm² or greater than about 3.2×10¹⁵ions/cm². The total ion implantation may also include one or more of theminimum dosage of indium at greater than about 1×10¹⁴ ions/cm² orgreater than about 1.1×10¹⁴ ions/cm², nitrogen at greater than 1.2×10¹⁵ions/cm² or greater than 1.4×10¹⁵ ions/cm², or carbon at greater thanabout 2.4×10¹⁵ ions/cm² or greater than about 2.5×10¹⁵ ions/cm².

The process in accordance with an embodiment of the present disclosurewas implemented and compared. Two baseline wafers where the overlay markregion experienced the same process as the device region were subjectedto CPE and residual overlay error measured. Two experimental waferswhere the overlay mark region experienced the ion implant process asdescribed herein were subjected to CPE and residual overlay errormeasured. The overlay errors after CPE for the baseline wafers were 16.3nm and 16.6 nm. These error values would require rework duringmanufacturing. The overlay errors after CPE for the experimental waferswere 5.5 nm and 6.2 nm. These overlay error values for the experimentalwafers show significant improvement in the overlay alignment using theprocesses in the present disclosure.

Using the same wafers, overlay errors were measured again using adifferent overlay mark and results compared after CPE. The baselinewafers had residual errors of 9.6 nm and 7.6 nm. The experimental wafershad residual errors of 3.3 nm and 3.2. Using a different overlay mark,the results again show significant improvement in the overlay alignmentusing the processes in the present disclosure.

The present disclosure is not limited to applications in which thesemiconductor structure includes a FET (e.g. MOS transistor) or SRAM,and may be extended to other integrated circuit having a metal gatestack and the overlay mark. For example, the semiconductor structuresmay include a dynamic random access memory (DRAM) cell, an imagingsensor, a capacitor and/or other microelectronic devices (collectivelyreferred to herein as microelectronic devices). In another embodiment,the semiconductor structure includes FinFET transistors. Of course,aspects of the present disclosure are also applicable and/or readilyadaptable to other type of transistor, including single-gatetransistors, double-gate transistors and other multiple-gatetransistors, and may be employed in many different applications,including sensor cells, memory cells, logic cells, and others.

The various patterning process may include forming a patternedphotoresist layer by a photolithography process. An exemplaryphotolithography process may include processing steps of photoresistspin-on coating, soft baking, mask aligning, exposing, post-exposurebaking, developing photoresist and hard baking. The photolithographyexposing process may also be implemented or replaced by other propermethods such as maskless photolithography, electron-beam writing,ion-beam writing, thermal lithography, and molecular imprint.

One aspect of this description relates to a partially fabricatedsemiconductor device. The partially fabricated semiconductor deviceincludes a semiconductor overlay structure. The semiconductor overlaystructure includes a first gate stack structure over the semiconductorsubstrate, the first gate stack structure being configured as an overlaymark in an overlay region of the semiconductor substrate. Thesemiconductor overlay structure further includes a doped region in thesemiconductor substrate surrounding the first gate stack structure. Thedoped region has a first dopant concentration greater than or equal to asecond dopant concentration next to a second gate stack structure in adevice region of the semiconductor substrate.

Another aspect of this description relates to an overlay mark. Theoverlay mark includes a doped region in an overlay region of asemiconductor substrate, wherein the overlay region is free of activedevices. The overlay mark further includes a plurality of gate stacksover the overlay region of the semiconductor substrate, wherein theplurality of gate stacks is arranged as a periodic grating structure. Atleast one gate stack of the plurality of gate stacks is a metal gatestack.

Still another aspect of this description relates to a semiconductordevice. The semiconductor device includes a semiconductor substratehaving a device region and an overlay region. The semiconductor devicefurther includes a doped region in the overlay region. The semiconductordevice further includes a first gate stack in the device region. Thesemiconductor device further includes a second gate stack in the overlayregion. The semiconductor device further includes a first oxide layerover the semiconductor substrate surrounding the second gate stack. Atotal boron concentration in the doped region is greater than a boronconcentration in the semiconductor substrate adjacent to the first gatestack. The second gate stack and the first oxide layer are measureablein an overlay error determination operation.

It is understood that various different combinations of the above-listedembodiments and steps can be used in various sequences or in parallel,and there is no particular step that is critical or required.Furthermore, features illustrated and discussed above with respect tosome embodiments can be combined with features illustrated and discussedabove with respect to other embodiments. Accordingly, all suchmodifications are intended to be included within the scope of thisinvention.

What is claimed is:
 1. A partially fabricated semiconductor device,comprising: a semiconductor overlay structure, the semiconductor overlaystructure comprising: a first gate stack structure over thesemiconductor substrate, the first gate stack structure being configuredas an overlay mark in an overlay region of the semiconductor substrate;a doped region in the semiconductor substrate surrounding the first gatestack structure; and a contact layer over the semiconductor substrate inthe vicinity of the first gate structure, wherein the doped region isbetween the first gate stack structure and the contact layer, whereinthe doped region has a first dopant concentration greater than a seconddopant concentration next to a second gate stack structure in a deviceregion of the semiconductor substrate.
 2. The partially fabricatedsemiconductor device of claim 1, wherein at least one of the first gatestack structure or the second gate stack structure comprises: a high-kdielectric material layer; and a metal layer over the high-k dielectricmaterial layer.
 3. The partially fabricated semiconductor device ofclaim 1, wherein at least one of the first gate stack structure or thesecond gate stack structure comprises: a silicon oxide layer; and apolysilicon layer over the silicon oxide layer.
 4. The partiallyfabricated semiconductor device of claim 1, wherein the first gate stackstructure is configured as a grating structure.
 5. The partiallyfabricated semiconductor device of claim 1, wherein the first gate stackstructure is configured as one box of a box-in-box structure.
 6. Thepartially fabricated semiconductor device of claim 5, wherein thecontact layer is configured as an inner box of the box-in-box structure.7. The partially fabricated semiconductor device of claim 1, wherein thedopant comprises boron fluoride (BF₂) or arsenic.
 8. The partiallyfabricated semiconductor device of claim 7, wherein the dopant furthercomprises indium, nitrogen, or carbon.
 9. The partially fabricatedsemiconductor device of claim 1, wherein the semiconductor substrate inthe overlay region includes silicon and has a refractive index of about3 or less.
 10. The partially fabricated semiconductor device of claim 1,further comprising a second gate structure in the overlay region,wherein the second gate structure comprises polysilicon, and the firstgate structure comprises metal.
 11. The partially fabricatedsemiconductor device of claim 1, further comprising an isolation featurebetween the first gate stack and the second gate stack.
 12. An overlaymark, comprising: a doped region in an overlay region of a semiconductorsubstrate, wherein the overlay region is free of active devices, and thedoped region is doped with one or more of boron fluoride (BF₂), arsenic,indium, nitrogen, or carbon; and a plurality of gate stacks over theoverlay region of the semiconductor substrate, wherein the plurality ofgate stacks is arranged as a periodic grating structure, wherein atleast one gate stack of the plurality of gate stacks is a metal gatestack, and an entirety of a bottom surface of the at least one gatestack forms an interface with the semiconductor substrate.
 13. Theoverlay mark of claim 12, wherein the at least one metal gate stackcomprises a metal layer over a high-k dielectric material layer.
 14. Theoverlay mark of claim 12, wherein at least one other gate stack of theplurality of gate stacks comprises: a silicon oxide layer; and apolysilicon layer over the silicon oxide layer.
 15. The overlay mark ofclaim 12, further comprising: a contact layer over the semiconductorsubstrate in the vicinity of at least one gate structure of theplurality of gate structures, wherein, in a plan view, the doped regionis between the at least one gate stack structure of the plurality ofgate structures and the contact layer.
 16. The overlay mark of claim 15,wherein the at least one gate stack of the plurality of gate stacks inthe vicinity of the contact layer is configured as one box of abox-in-box structure.
 17. The overlay mark of claim 16, wherein thecontact layer is configured as an inner box of the box-in-box structure.18. A semiconductor device, comprising: a semiconductor substrate havinga device region and an overlay region; a doped region in the overlayregion; a first gate stack in the device region; a second gate stack inthe overlay region; and a first oxide layer over the semiconductorsubstrate surrounding the second gate stack, wherein a total boronconcentration in the doped region is greater than a boron concentrationin the semiconductor substrate adjacent to the first gate stack, and thesecond gate stack and the first oxide layer are measureable in anoverlay error determination operation.
 19. The semiconductor device ofclaim 18, wherein the second gate stack is configured as one box of abox-in-box structure.
 20. The semiconductor device of claim 18, whereinthe second gate stack is further surrounded by an interlayer dielectriclayer and second oxide layer.